Edge list

Results from ConceptNet 5.8

Source: OpenCyc 2012
en photolithography semiconductor metrology (n)
― IsA ⟶
Weight: 1.0
en metrology (n) Source: OpenCyc 2012
en semiconductor wafer processing metrology (n)
― IsA ⟶
Weight: 1.0
en metrology (n) Source: OpenCyc 2012
en metrology (n)
― IsA ⟶
Weight: 1.0
en measuring event (n) Source: OpenCyc 2012
en semiconductor industry metrology (n)
― IsA ⟶
Weight: 1.0
en metrology (n) Source: OpenCyc 2012
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