en semiconductor wafer processing metrology

An English term in ConceptNet 5.8

Source: OpenCyc 2012
View this term in the API
  • Documentation
  • FAQ
  • Chat
  • Blog
  • Documentation
  • FAQ
  • Chat
  • Blog

semiconductor wafer processing metrology is a type of…

  • en metrology (n) âžœ
  • en semiconductor industry metrology (n) âžœ

Types of semiconductor wafer processing metrology

  • en photolithography semiconductor metrology (n) âžœ

Links to other resources

  • sw.opencyc.org /2012/05/10/concept/en/Semiconductor_wafer_processing_metrology
Creative Commons License
ConceptNet 5 is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License. If you use it in research, please cite this AAAI paper.
See Copying and Sharing ConceptNet for more details.